Inherent stochasticity during insulator-metal transition in VO2

Shaobo Cheng; Min Han Lee; Richard Tran; Yin Shi; Xing Li; Henry Navarro; Coline Adda; Qingping Meng; Long Qing Chen; R. C. Dynes; Shyue Ping Ong; Ivan K. Schuller; Yimei Zhu

doi:10.1073/pnas.2105895118

Inherent stochasticity during insulator-metal transition in VO₂

Shaobo Cheng
, Min Han Lee
, Richard Tran
, Yin Shi
, Xing Li
, Henry Navarro
, Coline Adda
, Qingping Meng
, Long Qing Chen
, R. C. Dynes
, Shyue Ping Ong
, Ivan K. Schuller
, Yimei Zhu

Department of Physics

Brookhaven National Laboratory Condensed Matter Physics and Materials Science Department
University of California San Diego
Department of Physics
Pennsylvania State University
Zhengzhou University

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	e2105895118
Journal	Proceedings of the National Academy of Sciences of the United States of America
Volume	118
Issue number	37
DOIs	https://doi.org/10.1073/pnas.2105895118
State	Published - Sep 14 2021

ASJC Scopus Subject Areas

General

Keywords

Insulator-metal transition
Operando transmission electron microscopy
Resistive switching

Access to Document

10.1073/pnas.2105895118

Cite this

Cheng, S., Lee, M. H., Tran, R., Shi, Y., Li, X., Navarro, H., Adda, C., Meng, Q., Chen, L. Q., Dynes, R. C., Ong, S. P., Schuller, I. K., & Zhu, Y. (2021). Inherent stochasticity during insulator-metal transition in VO₂. Proceedings of the National Academy of Sciences of the United States of America, 118(37), Article e2105895118. https://doi.org/10.1073/pnas.2105895118

@article{44591813e21a41d3bfc64de28e49afac,

title = "Inherent stochasticity during insulator-metal transition in VO2",

keywords = "Insulator-metal transition, Operando transmission electron microscopy, Resistive switching",

author = "Shaobo Cheng and Lee, \{Min Han\} and Richard Tran and Yin Shi and Xing Li and Henry Navarro and Coline Adda and Qingping Meng and Chen, \{Long Qing\} and Dynes, \{R. C.\} and Ong, \{Shyue Ping\} and Schuller, \{Ivan K.\} and Yimei Zhu",

year = "2021",

month = sep,

day = "14",

doi = "10.1073/pnas.2105895118",

language = "English",

volume = "118",

journal = "Proceedings of the National Academy of Sciences of the United States of America",

issn = "0027-8424",

number = "37",

}

TY - JOUR

T1 - Inherent stochasticity during insulator-metal transition in VO2

AU - Cheng, Shaobo

AU - Lee, Min Han

AU - Tran, Richard

AU - Shi, Yin

AU - Li, Xing

AU - Navarro, Henry

AU - Adda, Coline

AU - Meng, Qingping

AU - Chen, Long Qing

AU - Dynes, R. C.

AU - Ong, Shyue Ping

AU - Schuller, Ivan K.

AU - Zhu, Yimei

PY - 2021/9/14

Y1 - 2021/9/14

KW - Insulator-metal transition

KW - Operando transmission electron microscopy

KW - Resistive switching

UR - https://www.scopus.com/pages/publications/85114487402

UR - https://www.scopus.com/pages/publications/85114487402#tab=citedBy

U2 - 10.1073/pnas.2105895118

DO - 10.1073/pnas.2105895118

M3 - Article

C2 - 34493666

AN - SCOPUS:85114487402

SN - 0027-8424

VL - 118

JO - Proceedings of the National Academy of Sciences of the United States of America

JF - Proceedings of the National Academy of Sciences of the United States of America

IS - 37

M1 - e2105895118