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Quantification and characterization of Si in Pinus Insignis Dougl by TXRF

  • Laboratorio de Física Aplicada
  • Universidad de Concepción
  • Universidad Centro Lisandro Alvarado

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1495-1500
Number of pages6
JournalApplied Physics A: Materials Science and Processing
Volume118
Issue number4
DOIs
StatePublished - Mar 2014
Externally publishedYes

ASJC Scopus Subject Areas

  • General Chemistry
  • General Materials Science

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